Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure

被引:1
|
作者
Sun, CJ [1 ]
Chow, GM
Han, SW
Wang, JP
Hwu, YK
Je, JH
机构
[1] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore
[2] Chonbuk Natl Univ, Inst Proton Accelerator, Jeonju 561756, South Korea
[3] Chonbuk Natl Univ, Div Sci Educ, Jeonju 561756, South Korea
[4] Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA
[5] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
[6] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea
关键词
D O I
10.1063/1.2188041
中图分类号
O59 [应用物理学];
学科分类号
摘要
The phase miscibility of Co, Cr and Pt in oriented nanostructured CoCrPt magnetic thin films was investigated using anomalous x-ray scattering (AXS) from the (002) reflection and extended x-ray absorption fine structure (EXAFS) at Co K, Cr K and Pt L-III edges. The AXS measurements at Co K edge clearly showed the presence of Co in the crystalline region. However, Cr was not detected in the lattice. The EXAFS at Co K edge indicated that the nearest neighboring atoms of Co were mixed with 80% Co and 20% Pt, consistent with the results of EXAFS at Pt L-III edge. Our observations suggested that only Pt and Co were at the Co (002) lattice of the nanotextured CoCrPt thin films. This indicated that the AXS alone may not be reliable to determine the phase miscibility in textured thin films. Complementary information from the EXAFS was useful to understand the phase miscibility of nanoscale materials. (c) 2006 American Institute of Physics.
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页数:3
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