Synthesis and characterization of Tin Selenide thin films

Tin Selenide thin films were synthesized by spin coating and co-reduction from raw materials of SnCl2 center dot 2H(2)O and SeO2. The phase and morphology of the film products were investigated by X-ray diffraction (XRD), scanning electron microscope (SEM) and atomic force microscope (AFM) respectively. XRD results show that, the obtained SnSe2 thin film shows preferred growth trend along Z axis with crystal planes of (001), (002), (003) and (004); The crystallinity of film samples prepared at 160 degrees C, 170 degrees C and 180 degrees C increases with temperature rising. Relative pure SnSe2 phase with good crystallinity can be obtained in the film sample prepared at 180 degrees C while impurity phase SnSe appeared in the samples obtained at 200 degrees C. SEM and AFM results show that, the sample obtained by reacting twice at 180 degrees C for 10 h shows relatively dense and continuous film with rough surface and consists of most particles with diameters of about 0.1 similar to 0.5 mu m and a few larger particles. There are some few particles and many vertical nanoflakes or micropores in the film samples obtained at 200 degrees C.