Two-layer ultra-high density X-ray optical memory

被引：1

作者：

Bezirganyan, Hakob P. ^{[1
]}

Bezirganyan, Siranush E. ^{[2
]}

Bezirganyan, Hayk H., Jr. ^{[1
]}

Bezirganyan, Petros H., Jr. ^{[3
]}

机构：

[1] Yerevan State Univ, Yerevan 375049, Armenia

[2] Dept Med & Biol Phys, Yerevan, Armenia

[3] State Engn Univ Armenia, Dept Comp Sci, Yerevan, Armenia

来源：

BRILLIANT LIGHT IN LIFE AND MATERIAL SCIENCES | 2007年

关键词：

two-layer X-ray optical memory; data ultra-high density; grazing-angle incidence X-ray backscattering diffraction; grazing-angle incidence X-ray reflection;

D O I：

10.1007/978-1-4020-5724-3_50

中图分类号：

Q6 [生物物理学];

学科分类号：

071011 ;

摘要：

Data reading procedure from nanostructured semiconductor X-ray optical memory (X-ROM) system detects data by measuring the changes in x-ray micro beam intensity reflected from the various surface points of data storage media. Two different mechanisms of the digital information read-out procedure, which are utilizing grazing-angle incidence X-ray backscattering diffraction (GIXB) and grazing-angle incidence X-ray reflection (GIX) techniques respectively, enable, in principle, the fabrication and exploitation of two-layer X-ROM. Angle of incidence of the x-ray micro beam is different for each storage layer of the proposed two-layer X-ROM.

引用

页码：495 / +

页数：2

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