Broadband antireflection gratings for glass substrates fabricated by fast atom beam etching

被引:76
|
作者
Kanamori, Y
Kikuta, H
Hane, K
机构
[1] Tohoku Univ, Dept Mech & Precis Engn, Aoba Ku, Sendai, Miyagi 9808579, Japan
[2] Osaka Prefecture Univ, Coll Engn, Dept Mech Syst Engn, Sakai, Osaka 5998531, Japan
关键词
subwavelength grating; antireflection; fast atom beam; glass; micromachining; RCWA;
D O I
10.1143/JJAP.39.L735
中图分类号
O59 [应用物理学];
学科分类号
摘要
We fabricated a two-dimensional subwavelength-structured (SWS) surface on a glass substrate. The SWS surface was patterned by electron-beam lithography and etched by an SF6 fast atom beam. The SWS surface consisted of tapered gratings with a 150 nm period and a 150 nm deep groove. The reflectivity at wavelengths from 400 nm to 2000 nm was measured and compared with the results calculated on the basis of rigorous coupled-wave analysis. At wavelengths from 400 nm to 800 nm, the reflectivity of the glass surface decreased to 1% from the original value of 5% of the glass substrate. The reflectivity was also examined as a function of the incident angle by using He-Ne laser light.
引用
收藏
页码:L735 / L737
页数:3
相关论文
共 50 条
  • [41] Characteristics of ITO films fabricated on glass substrates by high intensity pulsed ion beam method
    Wang Chengyu
    Liu Yongxing
    Xia Yuanliang
    Ma Tengcai
    Wang, Paul W.
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2007, 353 (22-23) : 2244 - 2249
  • [42] An Electrochemical Method for Fast and Controlled Etching of Fluorine-Doped Tin Oxide Coated Glass Substrates
    Koiry, S. P.
    Jha, P.
    Veerender, P.
    Sridevi, C.
    Debnath, A. K.
    Chauhan, A. K.
    Muthe, K. P.
    Gadkari, S. C.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2017, 164 (02) : E1 - E4
  • [43] Large-area quartz glass microlens array fabricated by ion beam etching for focal plane detectors
    Zhang, XY
    Yi, XJ
    He, M
    Zhao, XR
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 1999, 18 (02) : 97 - 102
  • [44] Large-area Quartz Glass Microlens Array Fabricated by lon Beam Etching for Focal Plane Detectors
    张新宇
    易新建
    何苗
    赵兴荣
    红外与毫米波学报, 1999, (02) : 3 - 8
  • [45] Large-area quartz glass microlens array fabricated by ion beam etching for focal plane detectors
    Zhang, Xinyu
    Yi, Xinjian
    He, Miao
    Zhao, Xingrong
    Hedongli Gongcheng/Nuclear Power Engineering, 1999, 20 (01): : 97 - 101
  • [46] Blazed gratings with both controllable blaze angle and anti-blaze angle fabricated by using a twice oblique ion beam etching method
    Zhang, Di
    Mao, Xinyu
    Zeng, Lijiang
    APPLIED OPTICS, 2022, 61 (33) : 9972 - 9978
  • [47] Characterization of argon fast atom beam source and application to mesa etching process for GaInP/GaAs triple-barrier resonant tunneling diodes
    Suhara, Michihiko
    Matsuzaka, Norihiko
    Fukumitsu, Masakazu
    Okumura, Tsugunori
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (6 B): : 5504 - 5508
  • [48] Characterization of argon fast atom beam source and application to mesa etching process for GaInP/GaAs triple-barrier resonant tunneling diodes
    Suhara, Michihiko
    Matsuzaka, Norihiko
    Fukumitsu, Masakazu
    Okumura, Tsugunori
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (6B): : 5504 - 5508
  • [49] Large-hole anode-type fast atom beam (LA-FAB) source and its application to high-aspect-ratio GaAs etching
    Watanabe, K
    Hatakeyama, M
    Ichiki, K
    Satake, T
    Kato, T
    Nagai, K
    APPLIED SURFACE SCIENCE, 2001, 169 : 603 - 606
  • [50] Electrical characteristics, stability, electromigration, Joule heating, and reliability aspect of focused ion beam fabricated gold and copper nanobar interconnects on SiO2 and glass substrates
    Singh, Abhishek Kumar
    Kumar, Jitendra
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2020, 38 (06):