Optical metrology developments and applications in the transportation industry

被引：1
|
作者：
Hung, MYY
Chen, F
机构：
[1] City Univ Hong Kong, Mfg Engn & Engn Management Dept, Kowloon, Hong Kong, Peoples R China
[2] Ford Motor Co, Body Chassis NVH & Squeak Rattle Prevent Dept, Laser Imaging Lab, Detroit, MI 48202 USA
[3] Wayne State Univ, Detroit, MI 48202 USA
来源：
OPTICAL ENGINEERING | 2003年 / 42卷 / 05期
关键词：
D O I：
10.1117/1.1574513
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1186 / 1187
页数：2
相关论文
共 50 条
  • [1] Optical metrology in the transportation industry
    Chen, Frank
    Yang, Lianxiang
    [J]. OPTICAL ENGINEERING, 2007, 46 (05)
  • [2] Advances of optical metrology in the transportation industry
    Yang, Lianxiang
    Ettemeyer, Andreas
    [J]. OPTICAL ENGINEERING, 2011, 50 (10)
  • [3] Laser metrology developments and applications in the automotive industry
    Chen, F
    Griffen, CT
    [J]. OPTICAL ENGINEERING, 1998, 37 (05) : 1388 - 1389
  • [4] Developments in optical modeling methods for metrology
    Davidson, MP
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIII, PTS 1 AND 2, 1999, 3677 : 866 - 875
  • [5] Current developments on optical asphere and freeform metrology
    Muehlig, S.
    Siepmann, J.
    Lotz, M.
    Wiegmann, A.
    Blobel, G.
    Mika, S.
    Beutler, A.
    Nehse, U.
    [J]. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V, 2015, 9628
  • [6] Applications of optical fiber techniques to optical metrology
    Bao, NK
    Jin, GC
    Chung, PS
    [J]. INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS: ADVANCES AND APPLICATIONS, 1997, 2921 : 222 - 226
  • [7] ZA APPLICATIONS IN THE TRANSPORTATION INDUSTRY
    RUTHERFORD, JD
    SNODGRASS, EM
    [J]. CIM BULLETIN, 1986, 79 (890): : 86 - 86
  • [8] Applications of optical coherence in interferometric metrology
    de Groot, Peter J.
    [J]. SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, 2018, 10834
  • [9] Optical frequency dissemination for metrology applications
    Droste, Stefan
    Udem, Thomas
    Holzwarth, Ronald
    Haensch, Theodor Wolfgang
    [J]. COMPTES RENDUS PHYSIQUE, 2015, 16 (05) : 524 - 530
  • [10] Some selected problems of optical metrology in industry
    Rottenkolber, H
    [J]. INTERNATIONAL CONFERENCE ON APPLIED OPTICAL METROLOGY, 1998, 3407 : 225 - 235
12345