Suspended InAsnanowire gate-all-around field-effect transistors

被引:28
|
作者
Li, Qiang [1 ,2 ]
Huang, Shaoyun [1 ,2 ]
Pan, Dong [3 ]
Wang, Jingyun [1 ,2 ]
Zhao, Jianhua [3 ]
Xu, H. Q. [1 ,2 ,4 ]
机构
[1] Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China
[2] Peking Univ, Dept Elect, Beijing 100871, Peoples R China
[3] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
[4] Lund Univ, Dept Solid State Phys, S-22100 Lund, Sweden
基金
瑞典研究理事会; 中国国家自然科学基金; 高等学校博士学科点专项科研基金;
关键词
INAS NANOWIRE MOSFETS; ELECTRON-MOBILITY; QUANTUM DOTS; WRAP-GATE; PERFORMANCE; DIAMETER;
D O I
10.1063/1.4896105
中图分类号
O59 [应用物理学];
学科分类号
摘要
Gate-all-around field-effect transistors are realized with thin, single-crystalline, pure-phase InAs nanowires grown by molecular beam epitaxy. At room temperature, the transistors show a desired high on-state current I-on of similar to 10 mu A arid an on-off current ratio I-on/I-off of as high as 10(6) at sourcedrain bias voltage of 50 mV and gate length of 1 mu m with a gate underlap spacing of 1 mu m from the source and from the drain. At low temperatures, the on-state current I-on is only slightly reduced, while the ratio I-on/I-off is increased to 10(7). The field-effect mobility in the nanowire channels is also investigated and found to be similar to 1500 cm(2)/V s at room temperature and similar to 2000 cm(2)/V s at low temperatures. The excellent performance of the transistors is explained in terms of strong electrostatic and quantum confinements of carriers in the nanowires. (C) 2014 A1P Publishing LLC.
引用
收藏
页数:4
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