Diagnostic test generation based on subsets of faults

被引：0
|
作者：
Pomeranz, Irith [1 ]
Reddy, Sudhakar M. [2 ]
机构：
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
[2] Univ Iowa, Dept Elect & Comp Engn, Iowa City, IA 52242 USA
来源：
ETS 2007: 12TH IEEE EUROPEAN TEST SYMPOSIUM, PROCEEDINGS | 2007年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
We describe a diagnostic test generation procedure that deals with the large numbers of target fault pairs by considering subsets of faults. Each subset of faults is targeted separately during diagnostic test generation, and fault pairs are defined only out of the faults included in a subset. With M subsets of size K, the number of fault pairs considered is at most MK(K-1)/2 instead of N(N-1)/2 for a circuit with N target faults. Fault subsets can be defined using information about faults that are likely to be difficult or important to distinguish. In this work, fault subsets are defined based on structural analysis of the circuit.
引用
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页码：151 / +
页数：3
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