Single Event Latchup Results for COTS Devices Used on SmallSat Missions

被引：5
|
作者：
Vartanian, Sergeh [1 ]
Irom, Farokh [1 ]
Allen, Gregory R. [1 ]
Parker, Wilson P. [1 ]
O'Connor, Michael D. [1 ]
机构：
[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
来源：
2020 IEEE RADIATION EFFECTS DATA WORKSHOP (IN CONJUNCTION WITH 2020 NSREC) | 2020年
关键词：
D O I：
10.1109/REDW51883.2020.9325824
中图分类号：
O35 [流体力学]; O53 [等离子体物理学];
学科分类号：
070204 ; 080103 ; 080704 ;
摘要：
We present single event latchup (SEL) results for a variety of microelectronic devices frequently designated for SmallSat missions. The data presented is only a small representation of all the SEL tests performed in 2019.
引用
收藏
页码：78 / 81
页数：4
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