Single Event Latchup Results for COTS Devices Used on SmallSat Missions

被引：5
|
作者：
Vartanian, Sergeh [1 ]
Irom, Farokh [1 ]
Allen, Gregory R. [1 ]
Parker, Wilson P. [1 ]
O'Connor, Michael D. [1 ]
机构：
[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
来源：
2020 IEEE RADIATION EFFECTS DATA WORKSHOP (IN CONJUNCTION WITH 2020 NSREC) | 2020年
关键词：
D O I：
10.1109/REDW51883.2020.9325824
中图分类号：
O35 [流体力学]; O53 [等离子体物理学];
学科分类号：
070204 ; 080103 ; 080704 ;
摘要：
We present single event latchup (SEL) results for a variety of microelectronic devices frequently designated for SmallSat missions. The data presented is only a small representation of all the SEL tests performed in 2019.
引用
收藏
页码：78 / 81
页数：4
相关论文
共 50 条
  • [21] Experimental study on the single event latchup simulated by a pulse laser
    杨世宇
    曹洲
    李丹明
    薛玉雄
    田恺
    半导体学报, 2009, 30 (06) : 79 - 82
  • [22] Mitigation of Single Event Latchup in High-density SRAMs
    Panyshev, Kirill A.
    Lagaev, Dmitriy A.
    PROCEEDINGS OF THE 2021 IEEE CONFERENCE OF RUSSIAN YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING (ELCONRUS), 2021, : 2014 - 2019
  • [23] Single Event Effects in COTS Ferroelectric RAM Technologies
    Zhang, Zhangang
    Lei, Zhifeng
    Yang, Zhenlei
    Wang, Xiaohui
    Wang, Bin
    Liu, Jie
    En, Yunfei
    Chen, Hui
    Li, Bin
    2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 167 - 171
  • [24] Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Digital to Analog Converters
    Irom, Farokh
    Agarwal, Shri G.
    2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 183 - 190
  • [25] Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters
    Irom, Farokh
    Agarwal, Shri G.
    2012 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2012,
  • [26] Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch
    Marko S. Andjelković
    Vladimir Petrović
    Zoran Stamenković
    Goran S. Ristić
    Goran S. Jovanović
    Journal of Electronic Testing, 2015, 31 : 275 - 289
  • [27] Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch
    Andjelkovic, Marko S.
    Petrovic, Vladimir
    Stamenkovic, Zoran
    Ristic, Goran S.
    Jovanovic, Goran S.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, 31 (03): : 275 - 289
  • [28] Elimination of single event latchup in 90nm SRAM technologies
    Puchner, H.
    Kapre, R.
    Sharifzadeh, S.
    Majjiga, J.
    Chao, R.
    Radaelli, D.
    Wong, S.
    2006 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 44TH ANNUAL, 2006, : 721 - +
  • [29] Compact Modeling of Single-Event Latchup of Integrated CMOS Circuit
    Al Youssef, A.
    Artola, L.
    Ducret, S.
    Hubert, G.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 66 (07) : 1510 - 1515
  • [30] Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor
    Roche, N. J. -H.
    Khachatrian, A.
    Buchner, S.
    Foster, Charles C.
    Ferlet-Cavrois, V.
    Muschitiello, M.
    Miller, F.
    Morand, S.
    Warner, J.
    Decker, T.
    McMorrow, D.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (06) : 2679 - 2686
12345