Electronic and annealing properties of a metastable He-ion implantation induced defect in GaAs (reprinted from Nuclear Instruments and Methods in Physics Research, vol 106, pg 323-327, 1995)

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作者
Auret, FD [1 ]
Goodman, SA [1 ]
Erasmus, RM [1 ]
Meyer, WE [1 ]
Myburg, G [1 ]
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[1] UNIV PRETORIA,DEPT PHYS,ZA-0002 PRETORIA,SOUTH AFRICA
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:323 / 327
页数:5
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