Sulfur edge XANES and XPS spectroscopy of ethanethiol adsorbed on nickel

被引：9

作者：

Syed, JA

Sardar, SA

Yagi, S

Tanaka, K

机构：

[1] Hiroshima Univ, Dept Phys Sci, Hiroshima 7398526, Japan

[2] Nagoya Univ, Dept Crystalline Mat Sci, Nagoya, Aichi 4648603, Japan

来源：

SURFACE SCIENCE | 2004年 / 566卷

关键词：

X-ray absorption spectroscopy; X-ray photoelectron spectroscopy; nickel; sulphur; electrical transport (conductivity; resistivity; mobility; etc.);

D O I：

10.1016/j.susc.2004.06.131

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

For the interaction of ethanethiol (C2H5SH) with the Ni(110) surface, we utilize X-ray photoclectron spectroscopy (XPS) and X-ray absorption near-edge spectroscopy (XANES) measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. Upon adsorption on the Ni(110) surface, ethanethiolate as well as atomic sulfur is formed. For the ethanethiolate, the S-C bond is found predominantly perpendicular to the substrate as revealed by polarization analysis. A qualitative estimation of charge transfer from substrate to molecule is carried out with the aid of S 1s XPS measurements. (C) 2004 Published by Elsevier B.V.

引用

页码：597 / 602

页数：6

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