Relations between basic nuclear data and single-event upsets phenomena

被引:6
|
作者
Blomgren, J [1 ]
Granbom, B
Granlund, T
Olsson, N
机构
[1] Uppsala Univ, Dept Neutron Res, Uppsala, Sweden
[2] Indiana Univ, Bloomington, IN 47405 USA
[3] Stockholm Univ, S-10691 Stockholm, Sweden
[4] Swedish Def Res Agcy, Div Syst Technol, Uppsala, Sweden
[5] Uppsala Univ, Uppsala, Sweden
关键词
microelectronics; nuclear data; single-event upsets;
D O I
10.1557/mrs2003.39
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article approaches single-event upset (SEU) problems from the standpoint,of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections,(of chips) are measured over the neutron energy range of 20-150 MeV. Data from the same technology generation, in general, can be fitted into a simple curve. Second, the particle origins of SEUs are discussed from the framework of neutron-nucleus spallation reactions.
引用
收藏
页码:121 / 125
页数:5
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