共 50 条
- [41] A method for measuring the complex refractive index and thickness of a thin metal film APPLIED PHYSICS B-LASERS AND OPTICS, 2003, 77 (08): : 839 - 842
- [42] Syudy on a method of the thickness measurement of ultra-thin PtSi film Wuli Xuebao/Acta Physica Sinica, 2001, 50 (08):
- [44] A method for measuring the complex refractive index and thickness of a thin metal film Applied Physics B, 2003, 77 : 839 - 842
- [45] Thin-film fracture during nanoindentation of a titanium oxide film–titanium system Journal of Materials Research, 2001, 16 : 2634 - 2643
- [46] Thin film fracture during nanoindentation of hard film-soft substrate systems THIN FILMS: STRESSES AND MECHANICAL PROPERTIES IX, 2002, 695 : 317 - 322
- [47] Energy yield framework to simulate thin film CIGS solar cells and analyze limitations of the technology SCIENTIFIC REPORTS, 2025, 15 (01):
- [49] Characterizing the fracture of tantalum nitride films on AlN substrates through film thickness effects ADVANCES IN FRACTURE RESEARCH, VOLS 1-6, 1997, : 3075 - 3082
- [50] ON ENERGY BALANCE FOR PASSAGE OF LIGHT THROUGH A THIN ABSORBING FILM PHILIPS RESEARCH REPORTS, 1965, 20 (02): : 190 - &