Thick films of polycrystalline mercury iodide detectors

被引：0
|
作者：
Schieber, M [1 ]
Hermon, H
Zuck, A
Vilensky, A
Melekhov, L
Shatunovsky, R
Meerson, E
Saado, H
Pinkhasy, E
机构：
[1] Hebrew Univ Jerusalem, IL-91904 Jerusalem, Israel
[2] Real Time Radiog Readout, IL-91487 Jerusalem, Israel
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2000年 / 2卷 / 05期
关键词：
HgI2; detectors; thick films; semiconductors; polycrystalline; X-ray digital radiography;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Polycrystalline HgI2 thick film detectors are among the leading semiconductor materials to be used as direct converters in X-ray digital radiography. Their properties along with a survey of the properties of alternative materials such as PbI2 and A-Se will also be given. The preparation of HgI2 detector plates, using direct sublimation will be described. The microstructure of the thick films showing a columnar morphology, as determined by SEM measurements will be shown. The X-ray response to radiological X-ray generators of 60 and 80 kVp using the current integration mode will be reported. Finally some actual X-ray images taken at Xerox-Parc using HgI2 polycrystalline detectors will be shown.
引用
收藏
页码：569 / 574
页数：6
相关论文
共 50 条
  • [31] MAGNETOSTRICTIVE HYSTERESIS IN NICKEL POLYCRYSTALLINE THICK-FILMS
    BRARD, I
    GEORGES, R
    LEBLEVENNEC, G
    JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) : 5647 - 5649
  • [32] Microstructure of thick polycrystalline silicon films for MEMS application
    Zhou, HW
    Kharas, BG
    Gouma, PI
    SENSORS AND ACTUATORS A-PHYSICAL, 2003, 104 (01) : 1 - 5
  • [33] Nondestructive imaging with mercuric iodide thick film X-ray detectors
    Schieber, M
    Hermon, H
    Zuck, A
    Vilensky, A
    Melekhov, L
    Lukach, M
    Meerson, E
    Saado, H
    Shtekel, E
    Reisman, B
    Zentai, G
    Partain, L
    Seppi, E
    Pavlyuchkova, R
    Virshup, G
    Street, R
    Ready, S
    ADVANCED NONDESTRUCTIVE EVALUATION FOR STRUCTURAL AND BIOLOGICAL HEALTH MONITORING, 2001, 4335 : 43 - 51
  • [34] Polycrystalline mercuric iodide films: Deposition, properties, and detector performance
    Roy, UN
    Cui, Y
    Wright, G
    Barnett, C
    Burger, A
    Franks, LA
    Bell, ZW
    2001 IEEE NUCLEAR SCIENCE SYMPOSIUM, CONFERENCE RECORDS, VOLS 1-4, 2002, : 2310 - 2312
  • [35] Influence of evaporation conditions on the structure of the polycrystalline lead iodide films
    Li Yu-Hong
    He De-Yan
    Zhang Yu
    Li Zhen-Sheng
    ACTA PHYSICA SINICA, 2007, 56 (10) : 6028 - 6032
  • [36] Fabrication and characterization of large area mercuric iodide polycrystalline films
    Gui, Jianbao
    Guo, Jinchuan
    Yang, Qinlao
    Liu, Xufang
    Niu, Hanben
    ELECTRONIC IMAGING AND MULTIMEDIA TECHNOLOGY V, PTS 1 AND 2, 2008, 6833
  • [37] Polycrystalline mercuric iodide films: Deposition, properties, and detector performance
    Roy, UN
    Cui, Y
    Wright, G
    Barnett, C
    Burger, A
    Franks, LA
    Bell, ZW
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (04) : 1965 - 1967
  • [38] The superconductivity in boron-doped polycrystalline diamond thick films
    Wang, Z. L.
    Luo, Q.
    Liu, L. W.
    Li, C. Y.
    Yang, H. X.
    Yang, H. F.
    Li, J. J.
    Lu, X. Y.
    Jin, Z. S.
    Lu, L.
    Gu, C. Z.
    DIAMOND AND RELATED MATERIALS, 2006, 15 (4-8) : 659 - 663
  • [39] Type Conversion of Polycrystalline CdZnTe Thick Films by Multiple Compensation
    Kim, K. H.
    Won, J. H.
    Cho, S. H.
    Suh, J. H.
    Hong, J. K.
    Kim, S. U.
    2006 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOL 1-6, 2006, : 3643 - 3646
  • [40] Type conversion of polycrystalline CdZnTe thick films by multiple compensation
    Kim, KiHyun
    Choa, ShinHang
    Seo, JongHee
    Won, JaeHo
    Hong, JinKi
    Kim, SunUng
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2008, 584 (01): : 191 - 195
12345