Thick films of polycrystalline mercury iodide detectors

被引：0
|
作者：
Schieber, M [1 ]
Hermon, H
Zuck, A
Vilensky, A
Melekhov, L
Shatunovsky, R
Meerson, E
Saado, H
Pinkhasy, E
机构：
[1] Hebrew Univ Jerusalem, IL-91904 Jerusalem, Israel
[2] Real Time Radiog Readout, IL-91487 Jerusalem, Israel
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2000年 / 2卷 / 05期
关键词：
HgI2; detectors; thick films; semiconductors; polycrystalline; X-ray digital radiography;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Polycrystalline HgI2 thick film detectors are among the leading semiconductor materials to be used as direct converters in X-ray digital radiography. Their properties along with a survey of the properties of alternative materials such as PbI2 and A-Se will also be given. The preparation of HgI2 detector plates, using direct sublimation will be described. The microstructure of the thick films showing a columnar morphology, as determined by SEM measurements will be shown. The X-ray response to radiological X-ray generators of 60 and 80 kVp using the current integration mode will be reported. Finally some actual X-ray images taken at Xerox-Parc using HgI2 polycrystalline detectors will be shown.
引用
收藏
页码：569 / 574
页数：6
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