Thick films of polycrystalline mercury iodide detectors

被引：0

作者：

Schieber, M ^{[1
]}

Hermon, H

Zuck, A

Vilensky, A

Melekhov, L

Shatunovsky, R

Meerson, E

Saado, H

Pinkhasy, E

机构：

[1] Hebrew Univ Jerusalem, IL-91904 Jerusalem, Israel

[2] Real Time Radiog Readout, IL-91487 Jerusalem, Israel

来源：

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2000年 / 2卷 / 05期

关键词：

HgI2; detectors; thick films; semiconductors; polycrystalline; X-ray digital radiography;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Polycrystalline HgI2 thick film detectors are among the leading semiconductor materials to be used as direct converters in X-ray digital radiography. Their properties along with a survey of the properties of alternative materials such as PbI2 and A-Se will also be given. The preparation of HgI2 detector plates, using direct sublimation will be described. The microstructure of the thick films showing a columnar morphology, as determined by SEM measurements will be shown. The X-ray response to radiological X-ray generators of 60 and 80 kVp using the current integration mode will be reported. Finally some actual X-ray images taken at Xerox-Parc using HgI2 polycrystalline detectors will be shown.

引用

页码：569 / 574

页数：6

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