High-Resolution Alpha Spectrometry with a Thin-Window Silicon Carbide Semiconductor Detector

被引：11
|
作者：
Ruddy, Frank H. [1 ]
Seidel, John G. [2 ]
Sellin, Paul [3 ]
机构：
[1] Ruddy Consulting, 2162 Country Manor Dr, Mt Pleasant, SC 29464 USA
[2] Westinghouse Elect Co, Sci & Technol Dept, Pittsburgh, PA 15235 USA
[3] Univ Surrey, Dept Phys, Guildford GU2 7XH, Surrey, England
来源：
2009 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5 | 2009年
关键词：
D O I：
10.1109/NSSMIC.2009.5402072
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The potential for high-resolution alpha-particle energy spectrometry in high-temperature, high-radiation environments using thin-window 4H-SiC radiation detectors has been demonstrated. Pu-238 alpha-particle peaks separated by only 42.7 keV have been completely resolved using a SiC Schottky detector with a 400 angstrom titanium Schottky contact (entrance window). The observed FWHM for the Pu-238 5499.2-keV alpha particle peak is 20.6 keV or 0.37%. Factors affecting the observed alpha-particle energy resolution in SiC detectors will be discussed.
引用
收藏
页码：2201 / +
页数：3
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