The measurement of exonuclease activities by atomic force microscopy

被引:10
|
作者
Hori, K [1 ]
Takahashi, T [1 ]
Okada, T [1 ]
机构
[1] Natl Inst Adv Interdisciplinary Res, Joint Res Ctr Atom Technol, Ibaraki, Osaka 305, Japan
关键词
DNA; enzyme activity; atomic force microscopy; exonuclease; BAL; 31; nuclease;
D O I
10.1007/s002490050111
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
We have applied atomic force microscopy (AFM) to the measurement of BAL 31 nuclease activities. BAL 31 nuclease, a species of exonuclease, is used to remove unwanted sequences from the termini of DNA before cloning. For cutting out only the appropriate sequences, it is important to know the nuclease properties, such as digestion speed and the distribution of the lengths of the digested DNA. AFM was used to obtain accurate measurements on the lengths of DNA fragments before and after BAL 31 nuclease digestion. We analyzed 4 DNAs with known number of base pairs (288, 778, 1818, and 3162 base pairs) for correlating the contour length measured by AFM with the number of base pairs under the deposition conditions used. We used this calibration for analyzing DNA degradation by BAL 31 nuclease from the AFM measurement of contour lengths of digested DNAs. In addition, the distribution of digested DNA could be analyzed in more detail by AFM than by electrophoresis, because digested DNA were measured as a population by electrophoresis, but were measured individually by AFM. These results show that AFM will be a useful new technique for measuring nuclease activities.
引用
收藏
页码:63 / 68
页数:6
相关论文
共 50 条
  • [41] Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem
    Albert, Samuel
    Archambault, Aubin
    Petrosyan, Artyom
    Crauste-Thibierge, Caroline
    Bellon, Ludovic
    Ciliberto, Sergio
    [J]. EPL, 2020, 131 (01)
  • [42] Improved parallel scan method for nanofriction force measurement with atomic force microscopy
    Wang, Yu-Liang
    Zhao, Xue-Zeng
    Zhou, Fa-Quan
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (03):
  • [43] Measurement of Cell Detaching force on Substrates with Different Rigidity by Atomic Force Microscopy
    Chang, D. K.
    Chiou, Y. W.
    Tang, M. J.
    Yeh, M. L.
    [J]. 13TH INTERNATIONAL CONFERENCE ON BIOMEDICAL ENGINEERING, VOLS 1-3, 2009, 23 (1-3): : 1773 - +
  • [44] Application of optical force measurement to mode characterization of atomic force microscopy nanomachining
    Cho, Nahm G.
    Lee, Seoung Hwan
    [J]. PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE, 2013, 227 (08) : 1188 - 1198
  • [45] Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy
    Ono, Kohei
    Mizushima, Yuki
    Furuya, Masaki
    Kunihisa, Ryota
    Tsuchiya, Nozomu
    Fukuma, Takeshi
    Iwata, Ayumi
    Matsuki, Atsushi
    [J]. ATMOSPHERE, 2020, 11 (05)
  • [46] CAN ATOMIC FORCE MICROSCOPY TIPS BE INSPECTED BY ATOMIC FORCE MICROSCOPY
    HELLEMANS, L
    WAEYAERT, K
    HENNAU, F
    STOCKMAN, L
    HEYVAERT, I
    VANHAESENDONCK, C
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1309 - 1312
  • [47] The Jump-to-Contact Distance in Atomic Force Microscopy Measurement
    Wu, Jiunn-Jong
    [J]. JOURNAL OF ADHESION, 2010, 86 (11): : 1071 - 1085
  • [48] In situ friction measurement on murine cartilage by atomic force microscopy
    Coles, Jeffrey M.
    Blum, Jason J.
    Jay, Gregory D.
    Darling, Eric M.
    Guilak, Farshid
    Zauscher, Stefan
    [J]. JOURNAL OF BIOMECHANICS, 2008, 41 (03) : 541 - 548
  • [49] Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes
    Poik, Mathias
    Mayr, Mario
    Hackl, Thomas
    Schitter, Georg
    [J]. 2022 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC 2022), 2022,
  • [50] Measurement of transverse vibrations of piezoelectric ceramics by atomic force microscopy
    Ragulskis, M
    Maskeliunas, R
    [J]. EXPERIMENTAL TECHNIQUES, 2006, 30 (02) : 37 - 41