CAN ATOMIC FORCE MICROSCOPY TIPS BE INSPECTED BY ATOMIC FORCE MICROSCOPY

被引：32
|
作者：
HELLEMANS, L [1 ]
WAEYAERT, K [1 ]
HENNAU, F [1 ]
STOCKMAN, L [1 ]
HEYVAERT, I [1 ]
VANHAESENDONCK, C [1 ]
机构：
[1] UNIV LOUVAIN,DEPT PHYS,B-3001 LOUVAIN,BELGIUM
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 02期
关键词：
D O I：
10.1116/1.585185
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An attempt has been made to image prospective tips by atomic force microscopy. The apex of mounted diamond fragments and of traditional metallic tips was investigated by the same diamond probe. The peculiar tip-tip configuration allowed to search for the effect of sample rotation on the images. Identical images were obtained when the diamond stylus scanned different etched tungsten tips, illustrating an interchange in the roles of tip and sample.
引用
收藏
页码：1309 / 1312
页数：4
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