Electrochemistry of copper in chemical mechanical planarization (CMP) slurries containing glycine and hydrogen peroxide

被引:0
|
作者
Aksu, S [1 ]
Doyle, FM [1 ]
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
来源
CHEMICAL MECHANICAL PLANARIZATION V | 2002年 / 2002卷 / 01期
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暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
This study aims to improve our understanding of the removal mechanisms during copper CMP using hydrogen peroxide-glycine based slurries. First, copper dissolution behavior was examined in aqueous glycine solutions in the absence of H2O2 by correlating the results of potentiodynamic polarization experiments with the appropriate potential-pH diagram for the copper-water-glycine system. The polishing behavior in the absence of H2O2 was examined by in-situ polarization experiments. Finally, weight loss and polishing experiments were conducted to investigate the electrochemistry of copper in glycine solutions and slurries with different amounts H2O2.
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页码:79 / 90
页数:12
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