CMP Behavior of α-Alumina-g-Polyvinylpyrrolidone Composite Abrasive on Hard Disk Substrate

被引:0
|
作者
Lei, Hong [1 ]
Bu, Naijing [1 ]
Chu, Fengling [1 ]
Hao, Ping [1 ]
Hu, Xiaoli [1 ]
机构
[1] Shanghai Univ, Res Ctr Nanosci & Nanotechnol, Shanghai, Peoples R China
关键词
Chemical mechanical polishing; Hard disk substrate; alpha-Alumina-g-polyvinylpyrrolidone; Composite abrasive; Cleaning; NANOPARTICLE IMPACTS; HOLLOW SPHERES; DEFORMATION; COATINGS; SURFACE;
D O I
10.4028/www.scientific.net/AMR.97-101.2135
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A novel alpha-alumina-g-polyvinylpyrrolidone (alpha-Al(2)O(3)-g-PVP) composite abrasive was prepared by surface grafting polymerization. The chemical mechanical polishing (CMP) performances of the composite abrasive on hard disk substrate were investigated with a UNIPOL-1502 polishing machine. Analyses on the surface of polished substrate indicated that the alpha-Al(2)O(3)-g-PVP composite abrasive exhibited lower surface roughness, less scratch, and improved post-CMP cleaning performances than pure alpha-alumina abrasive under the same testing conditions.
引用
收藏
页码:2135 / 2139
页数:5
相关论文
共 50 条
  • [21] Influence of Zn (II) ion on abrasive-free polishing of hard disk substrate
    Lei, Hong
    Zhao, Rong
    Chen, Ruling
    THIN SOLID FILMS, 2014, 562 : 377 - 382
  • [22] AIBA as Free Radical Initiator for Abrasive-Free Polishing of Hard Disk Substrate
    Lei, Hong
    Ren, Xiaoyan
    JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (04) : 1245 - 1252
  • [23] AIBA as Free Radical Initiator for Abrasive-Free Polishing of Hard Disk Substrate
    Hong Lei
    Xiaoyan Ren
    Journal of Electronic Materials, 2015, 44 : 1245 - 1252
  • [24] Design of CMP slurry in CMP SiC crystal substrate (0001) Si surface based on alumina (Al2O3) abrasive
    Su, Jianxiu
    Zhang, Zhuqing
    Liu, Xinglong
    Liu, Zhixiang
    Feng, Qigao
    ADVANCED RESEARCH ON INFORMATION SCIENCE, AUTOMATION AND MATERIAL SYSTEMS III, 2013, 703 : 90 - +
  • [25] Effect of AIBI as Free Radical Initiator on Abrasive-Free Polishing of Hard Disk Substrate
    REN Xiao-yan
    LEI Hong
    CHEN Ru-ling
    CHEN Yi
    上海大学学报(自然科学版), 2014, 20 (06) : 680 - 688
  • [26] CMP of hard disk substrate using a colloidal SiO2 slurry:: preliminary experimental investigation
    Lei, H
    Luo, JB
    WEAR, 2004, 257 (5-6) : 461 - 470
  • [27] Post-CMP Cleaning of Atom-scale Planarization Surface of Computer Hard Disk Substrate
    Bu, Naijing
    Lei, Hong
    Chen, Ruling
    Hu, Xiaoli
    MANUFACTURING SCIENCE AND ENGINEERING, PTS 1-5, 2010, 97-101 : 1181 - 1185
  • [28] Cu (II) as a catalyst for hydrogen peroxide system abrasive-free polishing on hard disk substrate
    Wang, Zhijun
    Lei, Hong
    Zhang, Weitao
    Zhao, Rong
    MICRO-NANO TECHNOLOGY XIV, PTS 1-4, 2013, 562-565 : 91 - 95
  • [29] Effect of AIBA on Abrasive-free Polishing of Hard Disk Substrate with Peroxyacetic Acid System Slurry
    Ren, Xiao-yan
    Lei, Hong
    Design, Manufacturing and Mechatronics, 2014, 551 : 61 - 65
  • [30] Preparation of porous alumina/ceria composite abrasive and its chemical mechanical polishing behavior
    Chen, Sisi
    Lei, Hong
    Chen, Ruling
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2013, 31 (02):