Detective quantum efficiency [DQE(0)] of CZT semiconductor detectors for digital radiography

被引：1

作者：

Giakos, GC ^{[1
]}

Suryanarayanan, S

Guntupalli, R

Odogba, J

Shah, N

Vedantham, S

Chowdhury, S

Mehta, K

Sumrain, S

Patnekar, N

Moholkar, A

Kumar, V

Endorf, RE

机构：

[1] Univ Akron, Dept Elect & Comp Engn, Imaging Syst Detectors & Sensors Lab, Akron, OH 44325 USA

[2] Univ Akron, Dept Biomed Engn, Akron, OH 44325 USA

[3] Univ Akron, Div Engn & Appl Math, Akron, OH 44325 USA

[4] Univ Cincinnati, Dept Phys, Cincinnati, OH 45221 USA

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2004年 / 53卷 / 06期

关键词：

detective quantum efficiency; digital radiography; semiconductor detectors;

D O I：

10.1109/TIM.2004.834590

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the detective quantum efficiency (DQE) of cadmium zinc telluride (CZT) detector samples for digital radiography has been measured. Specifically, this study is aimed at investigating the zero-frequency DQE(0) under different X-ray tube and detector parameters. The experimental results of this study indicate that the DQE(0) of the CZT samples is strongly dependent upon the irradiation geometry. This is attributed to the incomplete charge collection process, which can be further improved by controlling the purity of the samples and the contact type.

引用

页码：1479 / 1484

页数：6

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