Parameter-free determination of the exchange constant in thin films using magnonic patterning

被引：11

作者：

Langer, M. ^{[1
,2
]}

Wagner, K. ^{[1
,2
]}

Sebastian, T. ^{[1
]}

Huebner, R. ^{[1
]}

Grenzer, J. ^{[1
]}

Wang, Yutian ^{[1
]}

Kubota, T. ^{[3
]}

Schneider, T. ^{[1
,4
]}

Stienen, S. ^{[1
]}

Lenz, K. ^{[1
]}

Schultheiss, H. ^{[1
]}

Lindner, J. ^{[1
]}

Takanashi, K. ^{[3
]}

Arias, R. E. ^{[5
]}

Fassbender, J. ^{[1
,2
]}

机构：

[1] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Bautzner Landstr 400, D-01328 Dresden, Germany

[2] Tech Univ Dresden, Inst Phys Solids, Zellescher Weg 16, D-01069 Dresden, Germany

[3] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan

[4] Tech Univ Chemnitz, Dept Phys, Reichenhainer Str 70, D-09126 Chemnitz, Germany

[5] Univ Chile, Dept Fis, CEDENNA, FCFM, Casilla 487-3, Santiago, Chile

来源：

APPLIED PHYSICS LETTERS | 2016年 / 108卷 / 10期

关键词：

SPIN-TRANSFER TORQUE; FERROMAGNETIC-RESONANCE; PERMALLOY;

D O I：

10.1063/1.4943228

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An all-electrical method is presented to determine the exchange constant of magnetic thin films using ferromagnetic resonance. For films of 20 nm thickness and below, the determination of the exchange constant A, a fundamental magnetic quantity, is anything but straightforward. Among others, the most common methods are based on the characterization of perpendicular standing spin-waves. These approaches are however challenging, due to (i) very high energies and (ii) rather small intensities in this thickness regime. In the presented approach, surface patterning is applied to a permalloy (Ni80Fe20) film and a Co2Fe0.4Mn0.6Si Heusler compound. Acting as a magnonic crystal, such structures enable the coupling of backward volume spin-waves to the uniform mode. Subsequent ferromagnetic resonance measurements give access to the spin-wave spectra free of unquantifiable parameters and, thus, to the exchange constant A with high accuracy. (C) 2016 AIP Publishing LLC.

引用

页数：4

共 50 条

[41] EDCONTOURS: HIGH-SPEED PARAMETER-FREE CONTOUR DETECTON USING EDPF
Akinlar, Cuneyt
Topal, Cihan
2012 IEEE INTERNATIONAL SYMPOSIUM ON MULTIMEDIA (ISM), 2012, : 153 - 156
[42] Parameter-free method for the shape optimization of stiffeners on thin-walled structures to minimize stress concentration
Liu, Yang
Shimoda, Masatoshi
Shibutani, Yoji
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, 2015, 29 (04) : 1383 - 1390
[43] Parameter-free method for the shape optimization of stiffeners on thin-walled structures to minimize stress concentration
Yang Liu
Masatoshi Shimoda
Yoji Shibutani
Journal of Mechanical Science and Technology, 2015, 29 : 1383 - 1390
[44] A Capability Improvement for Design of CSD Coefficient FIR Filters Using Parameter-free GA
Takekawa, Motohiro
Kato, Ryota
Suyama, Kenji
IEEJ Transactions on Electronics, Information and Systems, 2021, 141 (11): : 1158 - 1164
[45] A parameter-free approach for one-class classification using binary decision diagrams
Kutsuna, Takuro
Yamamoto, Akihiro
INTELLIGENT DATA ANALYSIS, 2014, 18 (05) : 889 - 910
[46] SLOW-ELECTRON COLLISIONS WITH CO MOLECULES IN AN EXACT-EXCHANGE PLUS PARAMETER-FREE POLARIZATION MODEL
JAIN, A
NORCROSS, DW
PHYSICAL REVIEW A, 1992, 45 (03): : 1644 - 1656
[47] A method for the determination of exchange and magnetocrystalline anisotropies in exchange-coupled thin films
Layadi, A
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2000, 219 (03) : 294 - 302
[48] Plasma-induced magnetic patterning of FePd thin films without and with exchange bias
Wang, Wei-Hsiang
Chang, Po-Chun
Jiang, Pei-hsun
Lin, Wen-Chin
APPLIED SURFACE SCIENCE, 2020, 527
[49] DETERMINATION OF THICKNESS OF THIN-FILMS ON METALS - (EXCHANGE OF EXPERIENCE)
BULYGIN, AS
MARTYNOV, NV
BILKO, GI
INDUSTRIAL LABORATORY, 1978, 44 (04): : 538 - 538
[50] Recombination rate constant of free electrons and holes in thin CdSe films
Radychev, N. A.
Novikov, G. F.
RUSSIAN CHEMICAL BULLETIN, 2006, 55 (05) : 766 - 769

← 1 2 3 4 5 →