High resolution probing of compliant surfaces using tapping-mode atomic force microscopy (TM-AFM) in liquids.

被引：0
|
作者：
Nnebe, IM [1 ]
Schneider, JW [1 ]
机构：
[1] Carnegie Mellon Univ, Dept Chem Engn, Pittsburgh, PA 15213 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 227卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
394-COLL
引用
收藏
页码：U867 / U867
页数：1
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