True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes

被引:80
|
作者
Klinov, D
Magonov, S
机构
[1] Russian Acad Sci, Shemyakin Ovchinnikov Inst Bioorgan Chem, Moscow 117871, Russia
[2] Veeco Instruments, Santa Barbara, CA 93117 USA
关键词
D O I
10.1063/1.1697629
中图分类号
O59 [应用物理学];
学科分类号
摘要
True molecular resolution was demonstrated in tapping-mode atomic force microscopy study of polydiacetylene crystal using carbon probes with an extremity of similar to1 nm. Images of the bc plane of the crystal, which were obtained at ambient conditions, reproduce the crystallographic molecular arrangement. The image features directly correspond to the edges of the individual side groups of the polymer chains, which form the crystal surface. In the consecutive images, the molecular-size defects have been observed on this surface as an additional proof of the true molecular resolution achieved with the probes. (C) 2004 American Institute of Physics.
引用
收藏
页码:2697 / 2699
页数:3
相关论文
共 50 条
  • [1] Tapping-mode atomic force microscopy produces faithful high-resolution images of protein surfaces
    Möller, C
    Allen, M
    Elings, V
    Engel, A
    Müller, DJ
    [J]. BIOPHYSICAL JOURNAL, 1999, 77 (02) : 1150 - 1158
  • [2] High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy
    Sahin, Ozgur
    Erina, Natalia
    [J]. NANOTECHNOLOGY, 2008, 19 (44)
  • [3] From images to interactions:: High-resolution phase imaging in tapping-mode atomic force microscopy
    Stark, M
    Möller, C
    Müller, DJ
    Guckenberger, R
    [J]. BIOPHYSICAL JOURNAL, 2001, 80 (06) : 3009 - 3018
  • [4] High-resolution imaging of antibodies by tapping-mode atomic force microscopy:: Attractive and repulsive tip-sample interaction regimes
    San Paulo, A
    García, R
    [J]. BIOPHYSICAL JOURNAL, 2000, 78 (03) : 1599 - 1605
  • [5] HIGH-RESOLUTION IMAGES OF CELL-SURFACE USING A TAPPING-MODE ATOMIC-FORCE MICROSCOPE
    UMEMURA, K
    ARAKAWA, H
    IKAI, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1993, 32 (11B): : L1711 - L1714
  • [6] High-resolution chemical mapping of surface bound functional groups with tapping-mode scanning force microscopy
    Finot, MO
    McDermott, MT
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1997, 119 (36) : 8564 - 8565
  • [7] Atomic resolution with high-eigenmode tapping mode atomic force microscopy
    Severin, N.
    Dzhanoev, A. R.
    Lin, H.
    Rauf, A.
    Kirstein, S.
    Palma, C. -A.
    Sokolov, I. M.
    Rabe, J. P.
    [J]. PHYSICAL REVIEW RESEARCH, 2022, 4 (02):
  • [8] Topological and Thermal Properties of Surfactant-Modified Clinoptilolite Studied by Tapping-Mode® Atomic Force Microscopy and High-Resolution Thermogravimetric Analysis
    E. J. Sullivan
    D. B. Hunter
    R. S. Bowman
    [J]. Clays and Clay Minerals, 1997, 45 : 42 - 53
  • [9] The role of adhesion in tapping-mode atomic force microscopy
    Sarid, D
    Hunt, JP
    Workman, RK
    Yao, X
    Peterson, CA
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S283 - S286
  • [10] Energy dissipation in tapping-mode atomic force microscopy
    Cleveland, JP
    Anczykowski, B
    Schmid, AE
    Elings, VB
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (20) : 2613 - 2615