The role of adhesion in tapping-mode atomic force microscopy

被引：23
|
作者：
Sarid, D [1 ]
Hunt, JP [1 ]
Workman, RK [1 ]
Yao, X [1 ]
Peterson, CA [1 ]
机构：
[1] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期
关键词：
D O I：
10.1007/s003390051146
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The equation of motion of the cantilever of an atomic force microscope (AFM) operating in the tapping mode in the presence of tip-sample adhesion modeled by the JKR theory is solved self-consistently. The vibration of the cantilever is discussed in terms of the parameters characterizing the properties of the cantilever, tip, and sample. A comparison with the experimental phase-shifts as a function of the setpoint reported by Magonov et al. is presented and sample indentation and tip-sample force and pressure are analyzed.
引用
收藏
页码：S283 / S286
页数：4
相关论文
共 50 条
  • [1] The role of adhesion in tapping-mode atomic force microscopy
    D. Sarid
    J.P. Hunt
    R.K. Workman
    X. Yao
    C.A. Peterson
    [J]. Applied Physics A, 1998, 66 : S283 - S286
  • [2] Energy dissipation in tapping-mode atomic force microscopy
    Cleveland, JP
    Anczykowski, B
    Schmid, AE
    Elings, VB
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (20) : 2613 - 2615
  • [3] Dynamic model of atomic force microscopy in tapping-mode
    Fan, Kang-Qi
    Jia, Jian-Yuan
    Zhu, Ying-Min
    Liu, Xiao-Yuan
    [J]. ACTA PHYSICA SINICA, 2007, 56 (11) : 6345 - 6351
  • [4] Lithography by tapping-mode atomic force microscopy with electrostatic force modulation
    B.I. Kim
    U.H. Pi
    Z.G. Khim
    S. Yoon
    [J]. Applied Physics A, 1998, 66 : S95 - S98
  • [5] Lithography by tapping-mode atomic force microscopy with electrostatic force modulation
    Kim, BI
    Pi, UH
    Khim, ZG
    Yoon, S
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S95 - S98
  • [6] Phase imaging and stiffness in tapping-mode atomic force microscopy
    Magonov, SN
    Elings, V
    Whangbo, MH
    [J]. SURFACE SCIENCE, 1997, 375 (2-3) : L385 - L391
  • [7] Analytical descriptions of the tapping-mode atomic force microscopy response
    Wang, L
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (25) : 3781 - 3783
  • [8] Nonlinear dynamics of tapping-mode atomic force microscopy in liquid
    Korayem, M. H.
    Ebrahimi, N.
    [J]. JOURNAL OF APPLIED PHYSICS, 2011, 109 (08)
  • [9] Linearity of amplitude and phase in tapping-mode atomic force microscopy
    Salapaka, MV
    Chen, DJ
    Cleveland, JP
    [J]. PHYSICAL REVIEW B, 2000, 61 (02): : 1106 - 1115
  • [10] Characterization of intermittent contact in tapping-mode atomic force microscopy
    Zhao, Xiaopeng
    Dankowicz, Harry
    [J]. JOURNAL OF COMPUTATIONAL AND NONLINEAR DYNAMICS, 2006, 1 (02): : 109 - 115
12345