共 50 条
- [31] Characterization of extreme ultraviolet lithography mask defects by actinic inspection with broadband extreme ultraviolet illumination [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (06): : 3000 - 3005
- [32] Extreme ultraviolet scanner with high numerical aperture: obscuration and wavefront description [J]. JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, 2022, 21 (02):
- [33] FABRICATION OF HIGH NUMERICAL APERTURE ZONE PLATES USING DEEP ULTRAVIOLET LITHOGRAPHY [J]. APPLIED OPTICS, 1984, 23 (03): : 504 - 507
- [34] Development of projection optics set-3 for high-numerical-aperture extreme ultraviolet exposure tool (HiNA) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (06): : 2975 - 2979
- [36] Direct aerial image measurements to evaluate the performance of an extreme ultraviolet projection lithography system [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 4000 - 4003
- [37] Role of landing energy in e-beam metrology of thin photoresist for high-numerical aperture extreme ultraviolet lithography [J]. JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, 2023, 22 (02):
- [39] Ultrasensitive metal-organic cluster resist for patterning of single exposure high numerical aperture extreme ultraviolet lithography applications [J]. JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, 2022, 21 (04):