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Metal-insulator transition in epitaxial V1-xWxO2(0<x<0.33) thin films
被引:186
|作者:
Shibuya, Keisuke
[1
]
Kawasaki, Masashi
[1
,2
]
Tokura, Yoshinori
[1
,3
,4
]
机构:
[1] RIKEN, Adv Sci Inst, CMRG, Wako, Saitama 3510198, Japan
[2] Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan
[3] Univ Tokyo, Dept Appl Phys, Tokyo 1138656, Japan
[4] Japan Sci & Technol Agcy JST, ERATO, Multiferro Project, Tokyo 1138656, Japan
关键词:
doping;
epitaxial layers;
ground states;
metal-insulator transition;
phase diagrams;
phase separation;
tungsten;
vanadium compounds;
MOTT-HUBBARD;
VO2;
TEMPERATURE;
V1-XWXO2;
PEIERLS;
VIEW;
D O I:
10.1063/1.3291053
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We have fabricated epitaxial V1-xWxO2(0 < x < 0.33) thin films on TiO2 (001) substrates. The metal-insulator transition temperature of VO2 is systematically reduced by W doping, and eventually a metallic ground state is realized at 0.08 < x < 0.09. Tiny resistivity upturn around 50 K observed for these films suggests an electronic phase separation between a majority metallic matrix and minority insulating puddles. With further increasing x above 0.095, another insulating phase appears while increasing the metal-insulator transition temperature. The elucidated phase diagram gives basic knowledge for devices based on Mott transition.
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页数:3
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