Jitter measurement circuit for mixed signal production test

被引：4
|
作者：
Xia, Tian
Campbell, Justin
Li, Jing
Wolf, Randy
Sweeney, John F.
机构：
[1] Univ Vermont, Dept Elect & Comp Engn, Burlington, VT 05405 USA
[2] IBM Microelect, RF Test Dev Grp, Essex Jct, VT 05452 USA
来源：
MEASUREMENT | 2007年 / 40卷 / 03期
关键词：
jitter measurements production test; analytical signal method;
D O I：
10.1016/j.measurement.2006.06.004
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper presents a novel low-cost jitter measurement circuit for production test. The hardware implementation is based on the so-called analytic signal method. The circuit consists of two parts: high-speed ADC sampling and DSP com-putation. The uniqueness of this circuit comes from the fact that the FPGA is used as both the ADC sampling controller and the main computation engine, which can significantly reduce the test cost. To validate the design effectiveness, measurements results have been compared between various instruments and this proposed circuit. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码：272 / 282
页数：11
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