Characteristics of organic light emitting diodes with tetrakis(ethylmethylamino) hafnium treated indium tin oxide

被引:8
|
作者
Sohn, Sunyoung
Park, Keunhee
Jung, Donggeun
Kim, Hyoungsub [1 ]
Chae, Heeyeop
Kim, Hyunmin
Yi, Junsin
Boo, Jin-hyo
机构
[1] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
[2] Sungkyunkwan Univ, Dept Chem Engn, Suwon 440746, South Korea
[3] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
[4] Yonsei Univ, Inst Phys & Appl Phys, Seoul 120729, South Korea
[5] Sungkyunkwan Univ, Brain Korea 21 Chem Res Div, Suwon 440746, South Korea
[6] Sungkyunkwan Univ, Dept Chem, Inst Basic Sci, Suwon 440746, South Korea
[7] Sungkyunkwan Univ, Dept Phys, Inst Basic Sci, Suwon 440746, South Korea
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2007年 / 46卷 / 17-19期
关键词
organic light emitting diodes; ALCVD; TEMAH; hafnium oxide; impedance analysis; NEXAFS spectroscopy;
D O I
10.1143/JJAP.46.L461
中图分类号
O59 [应用物理学];
学科分类号
摘要
The surface of indium tin oxide (ITO) in organic light emitting diodes (OLEDs) was treated using an atomic layer deposition with tetrakis(ethylmethy lamino) hafnium (TEMAH) and O-2 precursors. The treatment for 5 cycles at room temperature resulted in a significant improvement in the electroluminescent characteristics resulting from the increased hole injection. According to the various characterizations, an ultra-thin HfOx layer without any insulating properties was formed, which modified the electronic band structure of the ITO anode. When the number of cycles or temperature was increased, an electrically insulating HfOx, was formed, and the resulting OLED properties deteriorated.
引用
收藏
页码:L461 / L464
页数:4
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