Scheduling semiconductor device test operations

被引：0
|
作者：
CarmonFreed, T [1 ]
机构：
[1] XILINX INC,DEPT IND ENGN & OPERAT RES,SAN JOSE,CA 95124
来源：
NINETEENTH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM - PROCEEDINGS, 1996 IEMT SYMPOSIUM | 1996年
关键词：
D O I：
10.1109/IEMT.1996.559792
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：482 / 485
页数：4
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