On-line testing for VLSI

被引：2
|
作者：
Nicolaidis, M
机构：
来源：
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年
关键词：
D O I：
10.1109/TEST.1997.639731
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1042 / 1042
页数：1
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