An approach to the on-line testing of operational amplifiers

被引：8

作者：

Velasco-Medina, J ^{[1
]}

Nicolaidis, M ^{[1
]}

Lubaszewski, H ^{[1
]}

机构：

[1] TIMA INPG, F-38031 Grenoble, France

来源：

SEVENTH ASIAN TEST SYMPOSIUM (ATS'98), PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/ATS.1998.741627

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A new approach far the an-line testing of operational amplifiers embedded into analog and mired-signal circuits is presented in this paper. A built-in detector is used for providing an on-line test signal, which is suitable for concurrent error detection in operational amplifiers. The fault detection strategy is based on monitoring via an analog checker the normal output/input and the on-line signal of operational amplifiers. in this context, the circuitry associated to a self-checking operational amplifier is presented In order to evaluate the fault coverage and the performance degradation in the resulting operational amplifier. extensive simulations are performed considering catastrophic faults.

引用

页码：290 / 295

页数：6

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