Using fixed and adaptive multivariate SPC charts for online SMD assembly monitoring

被引:16
|
作者
Villalobos, JR [1 ]
Muñoz, L
Gutierrez, MA
机构
[1] Arizona State Univ, Elect Assembly Lab, Tempe, AZ 85287 USA
[2] Amkor Technol Inc, Chandler, AZ 85248 USA
基金
美国国家科学基金会;
关键词
statistical process control; multivariate control charts; electronics assembly; average run length; variable sampling interval;
D O I
10.1016/j.ijpe.2003.11.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper explores different alternatives for online monitoring of the assembly of surface mounted devices (SMD). The paper compares, thrice widely used multivariate control charts: Hotelling. multivariate exponentially weighted moving average (MEWMA), and multivariate cumulative sum (MCUSUM). Two different scenarios are analyzed: one in which the sampling interval is fixed, and another in which the sampling interval is variable. The results presented in this paper are part of the development of an integrated quality environment for SMD assembly. For the first scenario. where fixed sampling intervals were used, MEWMA outperformed Hotelling and MCUSUM. That is. MEWMA was faster to detect shifts ill the process mean. For the second scenario. where variable sampling intervals were used. only Hotelling was tested. The results showed that Hotelling with variable Sampling intervals performed better than MEWMA with fixed sampling intervals. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:109 / 121
页数:13
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