Vertical scanning long trace profiler: a tool for metrology of X-ray mirrors

被引:18
|
作者
Li, HZ [1 ]
Takacs, PZ [1 ]
Oversluizen, T [1 ]
机构
[1] Continental Opt Corp, Hauppauge, NY 11788 USA
关键词
interferometry; metrology; X-ray optics; synchrotron radiation optics; laser scanning device;
D O I
10.1117/12.295557
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Profiler (VSLTP) under a SBIR Phase II grant from NASA. The instrument is capable of scanning shell mirrors with a diameter as small as 100mm for a travel distance of 700mm in vertical configuration. Main components of the optical system are described. It has a beam separation set, a beam splitting set, a Fourier transform lens system, a penta prism pair, a Risley prism pair and a cylinder lens. The main hardware and software for implementation of the prototype instrument are also presented. They include the major mechanical structure, 9-axis motion control system and the data acquisition and analysis software. The design of the optical and mechanical systems makes the VSLTP very tolerable to the deformation of the slide deformation laser pattern shift and fluctuation due to temperature change. Results obtained from the Phase I show that the VSLTP instrument is capable of a measurement accuracy of 50 nm for the height and 1 microradian for the slope.
引用
收藏
页码:180 / 187
页数:8
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