XMM X-ray mirrors:: Metrology and optical performance

被引：1

作者：

Marioni, F ^{[1
]}

Radaelli, P ^{[1
]}

Raggio, ME ^{[1
]}

de Chambure, D ^{[1
]}

Lainé, R ^{[1
]}

机构：

[1] Media Lario, I-23842 Bosisio Parini, LC, Italy

来源：

OPTICAL FABRICATION AND TESTING | 1999年 / 3739卷

关键词：

XMM; metrology; micro-roughness measurement; HEW measurement; X-ray performance prediction;

D O I：

10.1117/12.360149

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In total, more than 500 X-ray mirrors have been produced by Media Lario for the assembly of the six XMM telescopes (one Qualification Model + three Flight Models + two spares). The X-ray performance of the individual mirrors has been evaluated both in terms of mirror shape and surface quality with the help of several metrology devices. In this paper we will present first the metrology operations which were applied on the XMM mirrors to predict their optical performance. Then, the metrology results will be analysed and compared to the performance obtained during the verification and calibration campaigns. Finally, from the large XMM experience, we will conclude by giving some recommendations on the metrology tools to be used for the prediction of the performance of the next generation of X-ray telescopes.

引用

页码：232 / 244

页数：13

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