A cross-sectional scanning tunneling microscopy study of IrO2 rutile single crystals

被引：12
|
作者：
Pai, Woei Wu [1 ]
Wu, T. Y.
Lin, C. H.
Wang, B. X.
Huang, Y. S.
Chou, H. L.
机构：
[1] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 106, Taiwan
[2] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 106, Taiwan
[3] Natl Taiwan Univ Sci & Technol, Dept Chem Engn, Taipei 106, Taiwan
来源：
SURFACE SCIENCE | 2007年 / 601卷 / 12期
关键词：
cross-sectional STM; XSTM; IrO2; STM; rutile; SURFACE; STM;
D O I：
10.1016/j.susc.2007.04.227
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Rutile iridium dioxide (IrO2) surfaces were studied by cross-sectional scanning tunneling microscopy (XSTM). Atomically flat surfaces prepared by in situ ultra high vacuum cleaving of crystalline platelets of thicknesses < 50 mu m were successfully demonstrated. In addition to (110) surface, several vicinal planes, e.g., (120), (130) and similar to (891), were also examined. The cleaved planes are close to bulk-terminated surfaces with predominant [001]-oriented bridge oxygen rows. Unlike TiO2, bright oxygen rows are imaged and oxygen defects appear as dim species. Our studies show that XSTM is a viable technique to study oxide surfaces that are otherwise difficult to prepare. (c) 2007 Published by Elsevier B.V.
引用
收藏
页码：L69 / L72
页数：4
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