A cross-sectional scanning tunneling microscopy study of IrO2 rutile single crystals

被引：12
|
作者：
Pai, Woei Wu [1 ]
Wu, T. Y.
Lin, C. H.
Wang, B. X.
Huang, Y. S.
Chou, H. L.
机构：
[1] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 106, Taiwan
[2] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 106, Taiwan
[3] Natl Taiwan Univ Sci & Technol, Dept Chem Engn, Taipei 106, Taiwan
来源：
SURFACE SCIENCE | 2007年 / 601卷 / 12期
关键词：
cross-sectional STM; XSTM; IrO2; STM; rutile; SURFACE; STM;
D O I：
10.1016/j.susc.2007.04.227
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Rutile iridium dioxide (IrO2) surfaces were studied by cross-sectional scanning tunneling microscopy (XSTM). Atomically flat surfaces prepared by in situ ultra high vacuum cleaving of crystalline platelets of thicknesses < 50 mu m were successfully demonstrated. In addition to (110) surface, several vicinal planes, e.g., (120), (130) and similar to (891), were also examined. The cleaved planes are close to bulk-terminated surfaces with predominant [001]-oriented bridge oxygen rows. Unlike TiO2, bright oxygen rows are imaged and oxygen defects appear as dim species. Our studies show that XSTM is a viable technique to study oxide surfaces that are otherwise difficult to prepare. (c) 2007 Published by Elsevier B.V.
引用
收藏
页码：L69 / L72
页数：4
相关论文
共 50 条
  • [21] Cross-sectional scanning tunneling microscopy and spectroscopy of InGaP/GaAs heterojunctions
    Dong, Y
    Feenstra, RM
    Semtsiv, MP
    Masselink, WT
    APPLIED PHYSICS LETTERS, 2004, 84 (02) : 227 - 229
  • [22] Shape Control of QDs Studied by Cross-sectional Scanning Tunneling Microscopy
    Keizer, J. G.
    Bozkurt, M.
    Bocquel, J.
    Koenraad, P. M.
    Mano, T.
    Noda, T.
    Sakoda, K.
    Clark, E. C.
    Bichler, M.
    Abstreiter, G.
    Finley, J. J.
    Lu, W.
    Rohel, T.
    Folliot, H.
    Bertru, N.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2011, 58 (05) : 1244 - 1250
  • [23] Ordering in ternary compound semiconductors studied with cross-sectional scanning tunneling microscopy
    Heinrich, AJ
    Wenderoth, M
    Rosentreter, MA
    Engel, K
    Schneider, MA
    Ulbrich, RG
    Weber, ER
    Uchida, K
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S959 - S962
  • [24] Local electronic structures of GaMnAs observed by cross-sectional scanning tunneling microscopy
    Tsuruoka, T
    Tachikawa, N
    Ushioda, S
    Matsukura, F
    Takamura, K
    Ohno, H
    APPLIED PHYSICS LETTERS, 2002, 81 (15) : 2800 - 2802
  • [25] The stoichiometry of InAs quantum dots determined by cross-sectional scanning tunneling microscopy
    Eisele, H
    Flebbe, O
    Kalka, T
    Heinrichsdorff, F
    Krost, A
    Bimberg, D
    Dahne-Prietsch, M
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1999, 215 (01): : 865 - 868
  • [26] Cross-sectional scanning tunneling microscopy of GaAsSb/GaAs quantum well structures
    Zuo, SL
    Hong, YG
    Yu, ET
    Klem, JF
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (07) : 3761 - 3770
  • [27] Cross-sectional scanning-tunneling microscopy of stacked InAs quantum dots
    Eisele, H
    Flebbe, O
    Kalka, T
    Preinesberger, C
    Heinrichsdorff, F
    Krost, A
    Bimberg, D
    Dähne-Prietsch, M
    APPLIED PHYSICS LETTERS, 1999, 75 (01) : 106 - 108
  • [28] CROSS-SECTIONAL IMAGING AND SPECTROSCOPY OF GAAS DOPING SUPERLATTICES BY SCANNING TUNNELING MICROSCOPY
    FEENSTRA, RM
    YU, ET
    WOODALL, JM
    KIRCHNER, PD
    LIN, CL
    PETTIT, GD
    APPLIED PHYSICS LETTERS, 1992, 61 (07) : 795 - 797
  • [29] Ellipsoidal InAs quantum dots observed by cross-sectional scanning tunneling microscopy
    Blokland, J. H.
    Bozkurt, M.
    Ulloa, J. M.
    Reuter, D.
    Wieck, A. D.
    Koenraad, P. M.
    Christianen, P. C. M.
    Maan, J. C.
    APPLIED PHYSICS LETTERS, 2009, 94 (02)
  • [30] Perspectives of cross-sectional scanning tunneling microscopy and spectroscopy for complex oxide physics
    Wang, Aaron
    Chien, TeYu
    PHYSICS LETTERS A, 2018, 382 (11) : 739 - 748
12345