Estimation of roughness-induced power absorption from measured surface profile data

被引：30
|
作者：
Gu, Xiaoxiong [1 ]
Tsang, Leung
Braunisch, Henning
机构：
[1] Univ Washington, Dept Elect Engn, Seattle, WA 98195 USA
[2] Intel Corp, Components Res, Chandler, AZ 85226 USA
来源：
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2007年 / 17卷 / 07期
关键词：
power absorption; power spectral density (PSD); rough surfaces;
D O I：
10.1109/LMWC.2006.899296
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a methodology for extracting the 2-D power spectral density of a statistically isotropic random rough surface from height measurements by utilizing fast Fourier-Bessel transform. We compute the additional propagation loss due to surface roughness by integrating the extracted spectral density via the formula of absorption enhancement factor. Results for a microstrip demonstrate good correlation between measured and estimated loss up to 20 GHz. It is also possible to choose a random rough surface model for the measured surface and use it to predict the roughness effect on power loss.
引用
收藏
页码：486 / 488
页数：3
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