Estimation of roughness-induced power absorption from measured surface profile data

被引：30

作者：

Gu, Xiaoxiong ^{[1
]}

Tsang, Leung

Braunisch, Henning

机构：

[1] Univ Washington, Dept Elect Engn, Seattle, WA 98195 USA

[2] Intel Corp, Components Res, Chandler, AZ 85226 USA

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2007年 / 17卷 / 07期

关键词：

power absorption; power spectral density (PSD); rough surfaces;

D O I：

10.1109/LMWC.2006.899296

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present a methodology for extracting the 2-D power spectral density of a statistically isotropic random rough surface from height measurements by utilizing fast Fourier-Bessel transform. We compute the additional propagation loss due to surface roughness by integrating the extracted spectral density via the formula of absorption enhancement factor. Results for a microstrip demonstrate good correlation between measured and estimated loss up to 20 GHz. It is also possible to choose a random rough surface model for the measured surface and use it to predict the roughness effect on power loss.

引用

页码：486 / 488

页数：3

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