A Holistic Methodology for System Margining and Jitter Tolerance Optimization in Post-Silicon Validation

被引:0
|
作者
Rangel-Patino, Francisco E. [1 ,2 ]
Viveros-Wacher, Andres [1 ,2 ]
Rayas-Sanchez, Jose E. [1 ]
Vega-Ochoa, Edgar A. [2 ]
Duron-Rosales, Ismael [2 ]
Hakim, Nagib [3 ]
机构
[1] ITESO, Dept Elect Syst & Informat, Tlaquepaque 45604, Jalisco, Mexico
[2] Intel Corp, Zapopan 45019, Jalisco, Mexico
[3] Intel Corp, MS SC12-214 2200 Mission Coll Blvd, Santa Clara, CA 95052 USA
关键词
margining; jitter tolerance; equalization; optimization; post-silicon validation; Kriging;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The optimization of receiver analog circuitry in modern high-speed input/output (HSIO) links is a very time consuming post-silicon validation process. Current industrial practices are based on exhaustive enumeration methods to improve either the system margins or the jitter tolerance compliance test. In this paper, these two requirements are addressed in a holistic optimization-based approach. We propose an innovative objective function based on these two metrics. Our method employs Kriging to build a surrogate model based on system margining and jitter tolerance measurements. The proposed method is able to deliver optimal system margins and guarantee jitter tolerance compliance while substantially decreasing the typical post-Si validation time.
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页数:4
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