A Unified Methodology for Pre-Silicon Verification and Post-Silicon Validation

被引:0
|
作者
Adir, Allon [1 ]
Copty, Shady [1 ]
Landa, Shimon [1 ]
Nahir, Amir [1 ]
Shurek, Gil [1 ]
Ziv, Avi [1 ]
Meissner, Charles [2 ]
Schumann, John [2 ]
机构
[1] IBM Res, Haifa, Israel
[2] IBM Server & Technol Grp, Austin, TX USA
关键词
GENERATION;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The growing importance of post-silicon validation in ensuring functional correctness of high-end designs increases the need for synergy between the pre-silicon verification and postsilicon validation. We propose a unified functional verification methodology for the pre-and post-silicon domains. This methodology is based on a common verification plan and similar languages for test-templates and coverage models. Implementation of the methodology requires a user-directable stimuli generation tool for the post-silicon domain. We analyze the requirements for such a tool and the differences between it and its pre-silicon counterpart. Based on these requirements, we implemented a tool called Threadmill and used it in the verification of the IBM POWER7 processor chip with encouraging results.
引用
收藏
页码:1590 / 1595
页数:6
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