Resistive Switching Multistate Nonvolatile Memory Effects in a Single Cobalt Oxide Nanowire

被引:232
|
作者
Nagashima, Kazuki [1 ]
Yanagida, Takeshi [1 ,2 ]
Oka, Keisuke [1 ]
Taniguchi, Masateru [1 ,2 ]
Kawai, Tomoji [1 ,3 ]
Kim, Jin-Soo [3 ]
Park, Bae Ho [3 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
[3] Konkuk Univ, Dept Phys, Div Quantum Phases & Devices, Seoul 143701, South Korea
关键词
Resistive switching; nonvolatile memory; nanowires; cobalt oxides; multistate memory; RESISTANCE;
D O I
10.1021/nl9042906
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A multistate nonvolatile memory operated at sublithographic scale has been strongly desired since other nonvolatile memories have confronted the fundamental size limits owing to their working principles. Resistive switching (RS) in metal-oxide-metal junctions, so-called ReRAM, is promising for next generation high-density nonvolatile memory. Self-assembled oxide nanowire-based RS offers an attractive solution not only to reduce the device size beyond the limitation of current lithographic length scales but also to extract the underlying nanoscale RS mechanisms. Here we demonstrate the multistate bipolar RS of a single Co3O4 nanowire (10 nm scale) with the endurance up to 10(8). In addition, we succeeded to extract a voltage-induced nanoscale RS mechanism rather than current-induced RS. These Findings would open up opportunities to explore not only for the intrinsic nanoscale RS mechanisms with the ultimate size limit but also for next generation multistate three-dimensional ReRAM.
引用
收藏
页码:1359 / 1363
页数:5
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