In this article, a comparative dosimetric study is used on two types of phosphors; the standard LiF (TLD-100) and a home-made LIF : ME,Cu,P to show that ion beam bombardment may be a useful tool in the study and improvement of radiation sensitive materials. In the bombardment process, either oxygen ion (chemically active) or argon ion (chemically inert) was used, having energy of 4 keV and 3 flux of 21 x 10(13) ions cm(-2) s(-1) and the obtained results were compared with each other. It has been found that the sensitivity of the home-made LIF : Mg,Cu,P has got a maximum of similar to+40% when pre-treated for 5 min with argon ion beam. Meanwhile the sensitivity for the standard LiF (TLD-100) phosphor has got a maximum of similar to+20% when pre-treated with oxygen ion for 10 min. (C) 1997 Elsevier Science B.V.