The influence of tip-sample interaction on step fluctuations on Ag(111)

被引：17

作者：

Mugele, F ^{[1
]}

Rettenberger, A ^{[1
]}

Boneberg, J ^{[1
]}

Leiderer, P ^{[1
]}

机构：

[1] Univ Konstanz, Fak Phys, D-78457 Konstanz, Germany

来源：

SURFACE SCIENCE | 1998年 / 400卷 / 1-3期

关键词：

low index single crystal surfaces; scanning tunneling microscopy; silver; surface diffusion;

D O I：

10.1016/S0039-6028(97)00843-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The fluctuations of the position of monatomic steps on Ag(ll1) are investigated by scanning tunneling microscopy (STM). We analyze the influence of tip-sample interaction by varying the gap impedance over more than two orders of magnitude. For tunneling tips providing a weak tip-sample interaction. wt show that the step position autocorrelation Function remains essentially unaltered. In this unperturbed case, the kinetics of step fluctuations are found to be dominated by one-dimensional mass transport. For larger variations of the rip-sample distance or for less favorable tip configurations. we observe a tip-induced increase of the step fluctuations. Our measurements suggest that this effect is caused rather by short-range Forces than bq the electric field in the tunneling gap. (C) 1998 Elsevier Science B.V.

引用

页码：80 / 86

页数：7

共 50 条

[41] Direct tip-sample interaction force control for the dynamic mode atomic force microscopy
Jeong, Younkoo
Jayanth, G. R.
Jhiang, Sissy M.
Menq, Chia-Hsiang
APPLIED PHYSICS LETTERS, 2006, 88 (20)
[42] Lateral stiffness of the tip and tip-sample contact in frictional force microscopy
Lantz, MA
OShea, SJ
Hoole, ACF
Welland, ME
APPLIED PHYSICS LETTERS, 1997, 70 (08) : 970 - 972
[43] Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system
Gotsmann, B
Fuchs, H
PHYSICAL REVIEW LETTERS, 2001, 86 (12) : 2597 - 2600
[44] Tip geometry and tip-sample interactions in scanning probe microscopy (SPM)
Koenders, L
Yacoot, A
FRINGE 2005, 2006, : 456 - +
[45] Photoinduced Tip-Sample Forces for Chemical Nanoimaging and Spectroscopy
O'Callahan, Brian T.
Yan, Jun
Menges, Fabian
Muller, Eric A.
Raschke, Markus B.
NANO LETTERS, 2018, 18 (09) : 5499 - 5505
[46] A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip-sample interaction forces
Eslami, Sohrab
Jalili, Nader
ULTRAMICROSCOPY, 2012, 117 : 31 - 45
[47] Tip-sample force interactions in STM/AFM images
Magonov, SN
Whangbo, MH
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 216 : U100 - U100
[48] Inverse calculation of the tip-sample interaction force in atomic force microscopy by the conjugate gradient method
Chang, WJ
Hsu, JC
Lai, TH
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (07) : 1123 - 1126
[49] AFM tip-sample convolution effects for cylinder protrusions
Shen, Jian
Zhang, Dan
Zhang, Fei-Hu
Gan, Yang
APPLIED SURFACE SCIENCE, 2017, 422 : 482 - 491
[50] Tip-sample capacitance in capacitance microscopy of dielectric films
Goto, K
Hane, K
JOURNAL OF APPLIED PHYSICS, 1998, 84 (08) : 4043 - 4048

← 1 2 3 4 5 →