The influence of tip-sample interaction on step fluctuations on Ag(111)

被引:17
|
作者
Mugele, F [1 ]
Rettenberger, A [1 ]
Boneberg, J [1 ]
Leiderer, P [1 ]
机构
[1] Univ Konstanz, Fak Phys, D-78457 Konstanz, Germany
关键词
low index single crystal surfaces; scanning tunneling microscopy; silver; surface diffusion;
D O I
10.1016/S0039-6028(97)00843-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The fluctuations of the position of monatomic steps on Ag(ll1) are investigated by scanning tunneling microscopy (STM). We analyze the influence of tip-sample interaction by varying the gap impedance over more than two orders of magnitude. For tunneling tips providing a weak tip-sample interaction. wt show that the step position autocorrelation Function remains essentially unaltered. In this unperturbed case, the kinetics of step fluctuations are found to be dominated by one-dimensional mass transport. For larger variations of the rip-sample distance or for less favorable tip configurations. we observe a tip-induced increase of the step fluctuations. Our measurements suggest that this effect is caused rather by short-range Forces than bq the electric field in the tunneling gap. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:80 / 86
页数:7
相关论文
共 50 条
  • [31] TIP-SAMPLE INTERACTION EFFECTS IN SCANNING-TUNNELING AND ATOMIC-FORCE MICROSCOPY
    CIRACI, S
    BARATOFF, A
    BATRA, IP
    PHYSICAL REVIEW B, 1990, 41 (05): : 2763 - 2775
  • [32] Step fluctuations on Ag(111) surfaces with C60
    Tao, C
    Stasevich, TJ
    Einstein, TL
    Williams, ED
    PHYSICAL REVIEW B, 2006, 73 (12):
  • [33] Measurement of the tip-sample capacitance for Si surfaces
    Kyoto Univ, Kyoto, Japan
    Surf Sci, 1-3 (532-535):
  • [34] Hysteretic behaviour of the tip-sample interaction on an InAs(110) surface:: an ab initio study
    Caciuc, V
    Hölscher, H
    Blügel, S
    Fuchs, H
    NANOTECHNOLOGY, 2005, 16 (03) : S59 - S62
  • [35] Tapping mode atomic force microscopy for nanoparticle sizing: Tip-sample interaction effects
    Ebenstein, Y
    Nahum, E
    Banin, U
    NANO LETTERS, 2002, 2 (09) : 945 - 950
  • [36] SIMULATION OF ATOMIC-FORCE MICROSCOPE TIP-SAMPLE SAMPLE-TIP RECONSTRUCTION
    MARKIEWICZ, P
    GOH, MC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03): : 1115 - 1118
  • [37] Quantitative analysis of tip-sample interaction in non-contact scanning force spectroscopy
    Palacios-Lidon, Elisa
    Colchero, Jaime
    NANOTECHNOLOGY, 2006, 17 (21) : 5491 - 5500
  • [38] Atomic force microscopy tip-sample interaction analysis using nanocontact mechanic models
    Daeinabi, K.
    Korayem, M. H.
    MICRO & NANO LETTERS, 2011, 6 (09) : 794 - 798
  • [39] High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction
    Noom, Jacques
    Smith, Carlas
    Verbiest, Gerard J.
    Katan, Allard J.
    Soloviev, Oleg
    Verhaegen, Michel
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2023, 22 : 273 - 279
  • [40] Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves
    Gotsmann, B
    Anczykowski, B
    Seidel, C
    Fuchs, H
    APPLIED SURFACE SCIENCE, 1999, 140 (3-4) : 314 - 319