Analysis of the Influence of Roughness on the Propagation Constant of a Waveguide via Two Sparse Stochastic Methods

被引:0
|
作者
Waeytens, Ruben [1 ]
Bosman, Dries [1 ]
Huynen, Martijn [1 ]
Gossye, Michiel [1 ]
Rogier, Hendrik [1 ]
Vande Ginste, Dries [1 ]
机构
[1] Univ Ghent, IMEC, Electromagnet Grp, IDLab,Dept Informat Technol, Ghent, Belgium
关键词
Interconnect structures; line edge roughness; stochastic testing; sparse polynomial chaos; UNCERTAINTY QUANTIFICATION;
D O I
10.1109/epeps48591.2020.9231312
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The aim of this contribution is to study the effect of roughness on the propagation constant in interconnect structures. For this purpose, a stochastic framework is constructed around a full-wave electromagnetic field solver. To reduce the number of repeated calls to the full-wave simulator, two sparse stochastic techniques have been implemented and tested. A balance between calculation time and accuracy is sought for and found, which is demonstrated for a rough rectangular waveguide.
引用
收藏
页数:3
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