共 50 条
- [42] 2D threshold-voltage model for high-k gate-dielectric MOSFETs Pan Tao Ti Hsueh Pao, 2006, 10 (1725-1731):
- [44] New Insights Into Gate-Dielectric Breakdown by Electrical Characterization of Interfacial And Oxide Defects With Reverse Modeling Methodology 2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2012,
- [45] Electrical modelling and design insight of a vertically movable gate field effect transistor for physical sensor applications MICRO & NANO LETTERS, 2012, 7 (11): : 1117 - 1120
- [47] STUDY OF ORGANIC THIN FILM TRANSISTOR WITH PHOTOPATTERNED GATE DIELECTRIC MODERN PHYSICS LETTERS B, 2012, 26 (31):
- [50] Optimization of Dry Oxidation Parameters for Gate Dielectric in PMOS Transistor NANOSCIENCE AND NANOTECHNOLOGY, 2009, 1136 : 565 - 569