Observation of rapid carrier relaxation in graphene oxide probed by ultrafast terahertz spectroscopy

被引：0
|
作者：
Kim, Jaeseok [1 ]
Oh, Juyeong [2 ]
In, Chihun [1 ]
Lee, Yun-Shik [3 ]
Norris, Theodore B. [4 ,5 ]
Jun, Seong Chan [2 ]
Choi, Hyunyong [1 ]
机构：
[1] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea
[2] Yonsei Univ, Dept Mech Engn, Seoul 120749, South Korea
[3] Oregon State Univ, Dept Phys, Corvallis, OR 97331 USA
[4] Univ Michigan, Ctr Ultrafast Opt Sci, Ann Arbor, MI 48109 USA
[5] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
来源：
2014 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2014年
关键词：
REDUCTION;
D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We investigate the carrier relaxation dynamics in graphene oxide (GO) using ultrafast optical-pump terahertz-probe spectroscopy. Unlike graphene, we observe the dynamics of GO show rapid percolation behaviors related to the multi-particle Auger scattering.
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页数：2
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