Exchange bias in a ferromagnetic semiconductor induced by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry

被引:26
|
作者
Olejnik, K. [1 ,2 ]
Wadley, P. [3 ]
Haigh, J. A. [3 ]
Edmonds, K. W. [3 ]
Campion, R. P. [3 ]
Rushforth, A. W. [3 ]
Gallagher, B. L. [3 ]
Foxon, C. T. [3 ]
Jungwirth, T. [2 ,3 ]
Wunderlich, J. [1 ,2 ]
Dhesi, S. S. [4 ]
Cavill, S. A. [4 ]
van der Laan, G. [4 ]
Arenholz, E. [5 ]
机构
[1] Hitachi Cambridge Lab, Cambridge CB3 0HE, England
[2] Acad Sci Czech Republic, Inst Phys, Vvi, Prague 16253 6, Czech Republic
[3] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England
[4] Diamond Light Source, Didcot OX11 0DE, Oxon, England
[5] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
来源
PHYSICAL REVIEW B | 2010年 / 81卷 / 10期
关键词
RAY CIRCULAR-DICHROISM; ABSORPTION-SPECTRA;
D O I
10.1103/PhysRevB.81.104402
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We demonstrate an exchange bias in (Ga,Mn)As induced by antiferromagnetic coupling to a thin overlayer of Fe. Bias fields of up to 240 Oe are observed. Using element-specific x-ray magnetic circular dichroism measurements, we distinguish a strongly exchange-coupled (Ga,Mn)As interface layer in addition to the biased bulk of the (Ga,Mn)As film. The interface layer remains polarized at room temperature.
引用
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页数:5
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